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Application Notes Process Performance Semion 2500 V4

Ion flux and energy measurement using Impedans Semion system in silicon etching with a pulsed HBr/O2 plasma.

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Application Notes Fundamental Research Langmuir Probe

Experimental investigations on time resolved characteristics of pulsed inductively coupled O2 /Ar plasmas using Impedans Langmuir Probe.

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Application Notes Fundamental Research Langmuir Probe Octiv Poly 2.0 Tool Characterization

Application of Impedans Langmuir Probe and Octiv Poly in ICP argon discharge to study electron kinetics and spatial transport

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Application Notes Fundamental Research Langmuir Probe Octiv Suite 2.0

AImpedans Langmuir Probe and Octiv Suite are used to study the time dependencies of pulsed inductively coupled Ar and Ar/CF4 discharges

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Application Notes Fundamental Research Langmuir Probe

Impedans Langmuir Probe is used to measure the negative ions in an electro-negative plasma

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Application Notes Process Performance Vertex

Ion energy and ion flux measurements through high-aspect ratio holes using the Vertex system

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Plato Probe Tool Characterization

Characterization of HiPIMS plasma via process compatible measurement probe

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Application Notes Process Performance Quantum

Measurement of deposition rates and ion energy distributions using the Quantum System

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Application Notes Moduli RF Spectrometer Octiv Poly 2.0 Octiv Suite 2.0 Process End Point Detection

Application of the Impedans Moduli RF Spectrometer for Detecting Clean and Small Open Area Etch Endpoints through RF Harmonic Emission from Plasma

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Application Notes Model Validation Semion 2500 V4

Ion energy and angular distributions measured in a planar Ar/O2 ICP using the Semion RFEA system

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Application Notes Process Performance Semion 2500 V4 Tool Characterization

Characterization of SiO2 pattern transfer in an ALE process using the Semion RFEA

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Application Notes Semion 2500 V4 Tool Characterization

Ion energy measurements of ions emitted by a mini-helicon thruster using Semion retarding field energy analyzer