Categories Application Notes Moduli RF Spectrometer Octiv Poly 2.0 Octiv Suite 2.0 Process End Point Detection Application of the Impedans Moduli RF Spectrometer for Detecting Clean and Small Open Area Etch Endpoints through RF Harmonic Emission from Plasma Post author By Sean Mulcahy Post date October 20, 2022
Categories Application Notes Langmuir Probe Process End Point Detection Floating potential measurements using Impedans Langmuir Probes for End Point detection in a plasma etching process of polymers Post author By Sean Mulcahy Post date September 19, 2022