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Application Notes Langmuir Probe Process Performance Semion 2500 V4 Semion 3KV Semion pDC

Semion RFEA used for Ion energy distribution measurements in RF and pulsed DC plasma discharges

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Application Notes Process Performance Semion 2500 V4

Using Impedans Semion RFEA System to measure the effect of gas pressure on Ion Energy in a very-high frequency (VHF) magnetron sputtering discharge.

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Application Notes Langmuir Probe Tool Characterization

Investigation of the performances of the microwave plasma source ‘Aura-wave’ by Impedans Langmuir Probe System

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Application Notes Semion 2500 V4 Tool Characterization

In-Orbit Demonstration of Novel Thruster, characterized by Impedans Semion Retarding Field Energy Analyzer

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Application Notes Octiv Suite 2.0 Process Performance Semion 2500 V4

Effect of substrate biasing on the ion properties of a magnetron sputtering system using Impedans’ Semion RFEA System and Octiv Suite 2.0 VI Probe

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Application Notes Langmuir Probe Tool Characterization

Application of Impedans Langmuir Probe for uniformity measurement in RF plasma source

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Application Notes Octiv Mono 2.0 Octiv Poly 2.0 Octiv Suite 2.0 Semion 2500 V4 Tool Characterization

Measurements of plasma produced by Inductively coupled array (INCA) with Impedans’ Langmuir Probe, Semion RFEA System and Octiv VI Probe

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Application Notes Fundamental Research Langmuir Probe

Electron negativity measurements during E to H transition in RF inductively coupled plasma using Impedans’ Langmuir Probe System

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Application Notes Model Validation Octiv Suite 2.0

Measurement of DC self bias and Ion flux using Impedans Octiv VI probe during plasma polymerization process in an asymmetric capacitively coupled plasma

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Application Notes Langmuir Probe Tool Characterization

Analysis of electron properties of an emissive cathode using Impedans’ Langmuir probe system

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Application Notes Fundamental Research Semion 2500 V4

Tailored ion energy distribution measurements at an rf-biased plasma electrode using Impedans’ Semion RFEA System

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Application Notes Fundamental Research Langmuir Probe

Microwave induced plasma characterization using Impedans Langmuir Probe